Olathe, KS, United States of America

Todd M McGinn

This inventor holds 1 USPTO granted patent. Top assignee: At+t Corp.. Active years: 1995.


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 1995

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1 patent (USPTO):Explore Patents

Title: The Innovations of Todd M McGinn

Introduction

Todd M McGinn is an accomplished inventor based in Olathe, Kansas. He holds a patent for an electroexplosive device that showcases his expertise in the field of semiconductor technology. His innovative approach has contributed to advancements in igniter chip design, particularly in enhancing crack detection features.

Latest Patents

Todd M McGinn's notable patent is for an electroexplosive device. This device includes a semiconductor igniter chip that features improved crack detection capabilities. The design incorporates diffused regions that allow for the detection of cracks through high leakage currents, which can be easily identified. This innovation is significant for ensuring reliability and safety in applications that utilize electroexplosive devices.

Career Highlights

Todd has made significant contributions to his field while working at AT&T Corp. His work has focused on developing technologies that enhance the performance and safety of electronic devices. With a patent portfolio that includes 1 patent, he has established himself as a key player in the innovation landscape.

Collaborations

Throughout his career, Todd has collaborated with talented individuals such as Wayne A Smith and Christopher Daniel Hruska. These partnerships have fostered a creative environment that encourages the development of groundbreaking technologies.

Conclusion

Todd M McGinn is a notable inventor whose work in electroexplosive devices has made a significant impact in the field of semiconductor technology. His innovative designs and collaborations highlight his commitment to advancing technology and improving safety standards.

Profile summary based on public USPTO records.
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