San Carlos, CA, United States of America

Tobias Olney

This inventor holds 1 USPTO granted patent. Top assignee: Oracle International Corporation. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tobias Olney. Retrieved from https://idiyas.com/inventor/tobias-olney

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: The Innovations of Tobias Olney

Introduction

Tobias Olney is a notable inventor based in San Carlos, California. He has made significant contributions to the field of technology, particularly in the area of file integrity evaluation. His work is characterized by a focus on ensuring the reliability and accuracy of electronically stored files.

Latest Patents

Tobias Olney holds a patent for a "System and method of evaluating the integrity of a set of files." This innovative system evaluates the integrity of files that contain hypertext links or other types of file references. The integrity evaluator assesses each file for various conditions, including broken references and invalid symbols. This patent is a testament to his commitment to enhancing data reliability.

Career Highlights

Olney is currently employed at Oracle International Corporation, where he continues to develop and refine his innovative ideas. His work at Oracle has allowed him to collaborate with other talented professionals in the tech industry, further advancing his contributions to technology.

Collaborations

One of his notable coworkers is Jedidja Lubbers. Their collaboration exemplifies the teamwork that drives innovation within their organization.

Conclusion

Tobias Olney's work in evaluating file integrity showcases his dedication to improving technology. His patent reflects a significant advancement in ensuring the reliability of electronically stored information.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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