ST-SULPICE, Switzerland

Tobias Kippenberg

This inventor holds 1 USPTO granted patent and 7 published patent applications. Top assignee: Ecole Polytechnique FÉDÉRALE De Lausanne (Epfl). Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tobias Kippenberg. Retrieved from https://idiyas.com/inventor/tobias-kippenberg-6aixymu8

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Tobias Kippenberg: Inventor in Electron Spectrometer Calibration

Introduction

Tobias Kippenberg is an inventor based in St-Sulpice, Switzerland, and is associated with École Polytechnique Fédérale de Lausanne (EPFL). His patent work includes a method for calibrating an electron spectrometer.

Latest Patents

Kippenberg is named on one patent, titled “Electron Spectrometer Calibration Method.” The invention concerns calibrating the energy dispersion of an electron spectrometer in a system that includes at least one electron emission source, electron optics, and the spectrometer. The method is intended to support calibration of the spectrometer’s energy-dispersion response. The patent record provided lists 1 patent.

Career Highlights

Kippenberg’s listed affiliation with EPFL connects his work to a university research environment. His patent reflects an interest in instrumentation and methods for electron spectroscopy.

Collaborations

The provided information identifies Paolo Cattaneo and Fabrizio Carbone as Kippenberg’s coworkers. Their names are associated with his professional context, though specific roles in the patent are not stated.

Conclusion

Tobias Kippenberg’s listed invention addresses electron spectrometer calibration, highlighting a contribution to measurement methods in scientific instrumentation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…