Eindhoven, Netherlands

Tjerk G Spanjer


Average Co-Inventor Count = 2.9

ph-index = 4

Forward Citations = 37(Granted Patents)


Company Filing History:


Years Active: 1989-2024

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21 patents (USPTO):Explore Patents

Title: Tjerk G Spanjer: A Pioneer in Electron Microscopy Innovations

Introduction

Tjerk G Spanjer is an accomplished inventor based in Eindhoven, Netherlands, known for his significant contributions to the field of electron microscopy. With a remarkable portfolio of 20 patents, he has made notable advancements that enhance the capabilities of electron microscopy, particularly in reducing off-axial aberrations.

Latest Patents

His latest inventions include a method, device, and system aimed at reducing off-axial aberration in electron microscopy. This innovative method adjusts the electron beam and the image beam to minimize aberrations, utilizing a beam adjusting component. The adjusting process involves both shifting and tilting to achieve precision in imaging. Another notable patent addresses the efficiency of sample image acquisition in transmission electron microscopy, providing a comprehensive solution to minimize throughput time during imaging sessions. Additionally, the invention encompasses an electron microscope and includes a non-transient computer-readable medium with a computer program designed to implement these methods effectively.

Career Highlights

Throughout his career, Tjerk has made a significant impact while working at prestigious companies, including U.S. Philips Corporation and Koninklijke Philips Corporation N.V. His experience in these organizations has allowed him to develop innovative techniques that push the boundaries of electron microscopy and contribute to advancements in the field.

Collaborations

Tjerk has collaborated with esteemed colleagues, such as Gerardus A Vrijssen and Nicolaas G Vink. Their joint efforts highlight the importance of collaborative innovation in the development of new technologies, particularly in the field of advanced microscopy.

Conclusion

Tjerk G Spanjer's contributions to electron microscopy through his innovative patents exemplify the significance of technological advancements in scientific research. His work not only enhances imaging capabilities but also streamlines processes in transmission electron microscopy. As an inventor, Tjerk continues to inspire future innovations that could further revolutionize the field.

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