Shaanxi, China

Ting Xu

This inventor holds 1 USPTO granted patent. Top assignee: Chang'an University. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ting Xu. Retrieved from https://idiyas.com/inventor/ting-xu-g21dzwlz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Ting Xu - Innovator in Wear Angle Detection Technology

Introduction

Ting Xu is a notable inventor based in Shaanxi, China. He has made significant contributions to the field of automatic detection methods, particularly in the area of wear angle detection. His innovative approach has the potential to enhance various applications in engineering and technology.

Latest Patents

Ting Xu holds a patent for a "Dual-neighborhood wear angle automatic detection method." This method involves constructing a proximal neighborhood and establishing grayscale differences between a pixel in a center area and pixels having first directions in the proximal neighborhood. It calculates deviation degrees of all pixels in the center area based on these grayscale differences. The method further constructs a distal neighborhood and focuses on pixels having second directions, calculating grayscale differences and deviation degrees to ultimately determine the wear angle.

Career Highlights

Ting Xu is affiliated with Chang'an University, where he continues to advance his research and development efforts. His work is characterized by a commitment to innovation and practical applications of technology.

Collaborations

Ting Xu collaborates with colleagues such as Mei Xiao and Lei Zhang, contributing to a dynamic research environment that fosters creativity and innovation.

Conclusion

Ting Xu's contributions to the field of automatic detection methods exemplify the spirit of innovation. His work not only advances technology but also sets a foundation for future developments in wear angle detection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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