Tainan, Taiwan

Ting-hsuan Miau

This inventor holds 1 USPTO granted patent. Top assignee: National Cheng-Kung University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ting-hsuan Miau. Retrieved from https://idiyas.com/inventor/ting-hsuan-miau

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations of Ting-hsuan Miau

Introduction

Ting-hsuan Miau is a notable inventor based in Tainan, Taiwan. He has made significant contributions to the field of optical systems, particularly with his innovative patent that enhances efficiency in image projection.

Latest Patents

Ting-hsuan Miau holds a patent for a "Cyclic exposure scanning system having distributed multi-lens and method thereof." This invention provides a system that includes a processor, a platform, an optical engine, a first optical imaging device, a second optical device, and a light guide structure. The system is designed to project first and second optical images, guiding them to their respective imaging devices. This method significantly increases efficiency and light source utilization.

Career Highlights

Ting-hsuan Miau is affiliated with National Cheng-Kung University, where he continues to engage in research and development in optical technologies. His work has been recognized for its innovative approach to solving complex imaging challenges.

Collaborations

Some of his notable coworkers include Yung-Chun Lee and Chun-ying Wu, who have collaborated with him on various projects related to optical systems.

Conclusion

Ting-hsuan Miau's contributions to the field of optical engineering exemplify the impact of innovative thinking in technology. His patent reflects a commitment to enhancing efficiency in imaging systems, showcasing the importance of research and collaboration in advancing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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