Green Island, NY, United States of America

Timothy W Skloss

This inventor holds 1 USPTO granted patent. Top assignee: Intermagnetics General Corporation. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Timothy W Skloss. Retrieved from https://idiyas.com/inventor/timothy-w-skloss

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Timothy W. Skloss

Introduction

Timothy W. Skloss is a notable inventor based in Green Island, NY (US). He has made significant contributions to the field of non-invasive inspection technologies. His work primarily focuses on utilizing magnetic resonance techniques to enhance product safety and quality.

Latest Patents

Skloss holds a patent for a method that allows for the non-invasive and contactless inspection of foil-enclosed packages. This innovative approach employs magnetic resonance techniques to increase RF transmission power, retune the RF transmitter and receiver coils, and enhance RF reception gain. This method enables the inspection of products within containers that have a substantial electrically conductive barrier oriented transversely to the exciting RF magnetic field.

Career Highlights

Timothy W. Skloss is associated with Intermagnetics General Corporation, where he has contributed to advancing inspection technologies. His expertise in magnetic resonance has positioned him as a key figure in the development of non-invasive inspection methods.

Collaborations

Skloss has worked alongside notable colleagues, including Ian L. Pykett and Michael J. Hennessy. Their collaborative efforts have furthered the research and development of innovative technologies in the field.

Conclusion

Timothy W. Skloss's contributions to non-invasive inspection technologies highlight his role as an influential inventor. His patented methods demonstrate the potential for improving product safety and quality through innovative techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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