Company Filing History:
1 out of 832,843 Years Active: 2002
Title: Inventor Profile: Timothy W Dowdle
Introduction
Timothy W Dowdle is a notable inventor based in Overland Park, Kansas. He has made significant contributions to the field of electronics with a focus on testing integrated circuit chips. His innovative ideas have led to the creation of a patent that showcases his dedication to advancing technology.
Latest Patents
Timothy Dowdle holds a patent for a probe and test socket assembly. This innovative design features spring biased plunger probes of exceptionally small diameter, measuring only 0.02 inches. These densely packed probes are embedded within a test socket specifically engineered for the testing of integrated circuit chips. The socket consists of two separate halves designed with bores to house the probes effectively. An important aspect of his invention is that the plungers and barrel of the probes are not crimped or secured together, which helps maintain constant electrical resistance while ensuring ease of manufacturing. This unique assembly is particularly beneficial for testing densely packed arrays of fine diameter probes in integrated circuits.
Career Highlights
Throughout his career, Timothy Dowdle has clearly demonstrated his inventive spirit and technical expertise. His patent reflects his ability to tackle complex challenges within the electronics industry, paving the way for advancements in testing methods for integrated circuits.
Collaborations
In the course of his work, Timothy has collaborated with esteemed colleagues, including David W Henry and William E Thurston. These partnerships illustrate the collaborative nature of innovation and highlight the importance of teamwork in achieving groundbreaking developments.
Conclusion
Timothy W Dowdle's contributions to the field of electronics and his patented innovations emphasize the critical role inventors play in technology advancement. His work in creating new testing methods for integrated circuit chips not only showcases his ingenuity but also contributes significantly to the efficiency and effectiveness of electronic testing processes.