The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2002
Filed:
Jul. 14, 2000
David W. Henry, Liberty, MO (US);
William E. Thurston, Kansas City, MO (US);
Timothy W. Dowdle, Overland Park, KS (US);
Other;
Abstract
A probe and test socket assembly wherein spring biased plunger probes of extraordinarily small diameter, such as 0.02 inch, are densely packed into a test socket for testing of integrated circuit chips. The socket is constructed in upper and lower halves with bores to receive the probes. To manufacture probes of such small diameter and to provide minimal and constant electrical resistance, the plungers and barrel of the probes are not crimped or otherwise secured together. The configuration of the socket bore walls in combination with the probe maintains the probe plunger and barrel together. The assembly is particularly useful in densely packed arrays of extremely fine diameter probes for testing densely packed test sites.