Amsterdam, Netherlands

Timo Bechger

This inventor holds 1 USPTO granted patent. Top assignee: Tata Consultancy Services Limited. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Timo Bechger. Retrieved from https://idiyas.com/inventor/timo-bechger

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Timo Bechger: Inventor in Educational Assessment

Introduction

Timo Bechger is an inventor associated with Amsterdam, the Netherlands, and Tata Consultancy Services Limited. His patent work addresses multi-stage testing calibration, a process used to ensure that examinees who take different combinations of test modules are assessed on a common scale.

Latest Patents

The provided information lists one patent for Bechger: Method and System for Multi-Stage Testing (MST) Calibration. The invention describes a module-wise calibration approach that estimates a shift parameter from differences in average difficulty between pairs of modules. It then uses that estimate to align the modules’ average difficulty levels to a common scale. This approach is intended to address limitations of existing methods, which may be computationally demanding or unstable, or may produce standard errors in estimated item parameters.

Career Highlights

Bechger is associated with Tata Consultancy Services Limited. His listed patent focuses on a technical method for calibrating multi-stage assessments so that results from different module combinations can be compared on a shared scale.

Collaborations

The provided information names Gunter Maris and Gaurav Tandon as Bechger’s coworkers. It does not specify their roles in the patent or the nature of their collaboration.

Conclusion

Timo Bechger’s listed invention presents a module-wise approach to multi-stage testing calibration, aiming to place examinees who take different test modules on a common assessment scale.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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