Toronto, Canada

Tilmann Rabl

This inventor holds 2 USPTO granted patents. Top assignee: International Business Machines Corporation. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tilmann Rabl. Retrieved from https://idiyas.com/inventor/tilmann-rabl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2015

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2 patents (USPTO):Explore Patents

Title: Tilmann Rabl: Data Storage Innovation

Introduction

Tilmann Rabl is an inventor associated with Toronto, Canada, and International Business Machines Corporation. His patent work includes a log data store designed to organize records across different types of storage devices. The supplied information lists 2 patents.

Latest Patents

Rabl’s latest patent, “Log Data Store That Stores Data Across a Plurality of Storage Devices Using Non-Disjoint Layers,” describes a system for storing records across a sequence of overlapping layers. The first layer resides in main memory, intermediate layers use storage-class memory devices, and the final layer is stored on a hard disk drive. Each successive layer grows exponentially in size, and records are organized across the layers and storage devices.

Career Highlights

Rabl’s patent work addresses data organization across a hierarchy of storage technologies. The described approach combines main memory, storage-class memory, and hard disk drives in a single log data store.

Collaborations

Rabl’s listed coworkers include Hans-Arno Jacobsen and Mohammad Sadoghi Hamedani. His work is associated with International Business Machines Corporation.

Conclusion

Tilmann Rabl’s patent profile highlights an approach to log-based data storage that distributes records across multiple storage devices using exponentially growing, non-disjoint layers.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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