Budapest, Hungary

Tibor Pavelka

This inventor holds 2 USPTO granted patents. Top assignees: Semilab Felvezeto Fizikai Lab, Rt, Semilab Felvezto Fizikai Laboratorium Rt. Active years: 1995-2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tibor Pavelka. Retrieved from https://idiyas.com/inventor/tibor-pavelka

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.7

ph-index = 2

Forward Citations = 24(Granted Patents)


Company Filing History:


Years Active: 1995-2003

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2 patents (USPTO):Explore Patents

Title: Tibor Pavelka: Innovator in Semiconductor Technology

Introduction

Tibor Pavelka is a notable inventor based in Budapest, Hungary. He has made significant contributions to the field of semiconductor technology, holding 2 patents that showcase his innovative approach to measuring and improving semiconductor performance.

Latest Patents

Pavelka's latest patents include a surface passivation method and an arrangement for measuring the lifetime of minority carriers in semiconductors. The first invention relates to a method and arrangement for passivating the surface of semiconductor samples. This method allows for the simultaneous determination of the lifetime of free carriers by illuminating the semiconductor sample with a light pulse of higher energy than the forbidden band of the material. The resistance change in the semiconductor, resulting from this illumination, is measured using a microwave reflectometer. The essence of this method lies in continuously electrically charging the surface part of the semiconductor sample during measurement.

The second patent describes a contactless apparatus for measuring contaminants in a semiconductor specimen. This apparatus includes a tunable microwave generator coupled to a tuned narrowband microstrip antenna. The antenna directs microwave energy toward the specimen, providing a more powerful microwave field than previous systems. A pulsed laser directs optical energy through the antenna toward the specimen surface, generating minority carriers that begin to recombine after each pulse. The decay of minority lifetime affects the microwave energy reflecting from the specimen, which is then processed by a computer system for analysis.

Career Highlights

Throughout his career, Tibor Pavelka has worked with Semilab Felvezeto Fizikai Laboratorium Rt and Semilab Felvezeto Fizikai Lab, Rt. His work in these organizations has contributed to advancements in semiconductor technology and measurement techniques.

Collaborations

Pavelka has collaborated with notable colleagues such as Gyorgy Ferenczi and Zoltan Mirk. Their combined expertise has furthered research and development in the semiconductor field.

Conclusion

Tibor Pavelka's innovative patents and career achievements highlight his significant role in advancing semiconductor technology. His contributions continue to influence the industry and pave the way for future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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