Jiangmen, China

Tian Qiu

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Wuyi University. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tian Qiu. Retrieved from https://idiyas.com/inventor/tian-qiu-ubjncca2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Innovations of Tian Qiu in 3D Vision Systems

Introduction

Tian Qiu is a notable inventor based in Jiangmen, China. He has made significant contributions to the field of 3D vision systems, particularly through his innovative patent that enhances calibration methods.

Latest Patents

Tian Qiu holds 1 patent for a "Full-automatic calibration method and apparatus oriented to structured light 3D vision system." This invention discloses a method that allows for full-automatic calibration of a structured light 3D vision system without the need to move the system itself. For unfixed systems, calibration can be completed without any manual operation. This innovation enables non-professionals to easily calibrate structured light 3D imaging and addresses the challenges of calibrating numerous 3D cameras.

Career Highlights

Tian Qiu is affiliated with Wuyi University, where he continues to advance research in 3D vision technologies. His work has garnered attention for its practical applications and ease of use.

Collaborations

Tian has collaborated with colleagues such as Xin Zhang and Peiwen Wu, contributing to the development of innovative solutions in their field.

Conclusion

Tian Qiu's contributions to the field of 3D vision systems through his patented innovations demonstrate his commitment to advancing technology and making complex processes more accessible.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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