Grenoble, France

Thomas Lucas

This inventor holds 2 USPTO granted patents and 11 published patent applications and 1 EPO patent. Top assignee: Naver Corporation. Active years: 2024-2025.

USPTO Granted Patents = 2 

% Patents Active = 100.0

 

Average Co-Inventor Count = 5.5

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2024-2025

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2 patents (USPTO):Explore Patents

Title: Thomas Lucas - Innovator in Image Retrieval Systems

Introduction

Thomas Lucas is a notable inventor based in Grenoble, France. He has made significant contributions to the field of image retrieval systems, showcasing his innovative spirit and technical expertise.

Latest Patents

Lucas holds a patent for "Systems and methods for image retrieval using super features." This patent describes an image retrieval system that includes a neural network module configured to generate local features based on an input image. Additionally, it features an iterative attention module that generates an ordered set of super features in the input image based on the local features. The selection module is designed to select a second image from a database based on the second image having a second ordered set of super features that closely match the ordered set of super features in the input image. Notably, the super features in the set do not include redundant local features of the input image. He has 1 patent to his name.

Career Highlights

Thomas Lucas is currently employed at Naver Corporation, where he continues to develop and refine his innovative ideas. His work has positioned him as a key player in the advancement of image retrieval technologies.

Collaborations

Lucas collaborates with esteemed colleagues such as Philippe Weinzaepfel and Diane Larlus, contributing to a dynamic and innovative work environment.

Conclusion

Thomas Lucas exemplifies the spirit of innovation in the field of image retrieval systems. His contributions and collaborations continue to influence advancements in technology.

Profile summary based on public USPTO records.
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