Munich, Germany

Thomas Kuhn

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Wurth International Ag. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Thomas Kuhn. Retrieved from https://idiyas.com/inventor/thomas-kuhn-rnsvqo35

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Thomas Kuhn - Innovator in Substrate Characterization

Introduction

Thomas Kuhn is a notable inventor based in Munich, Germany. He is recognized for his contributions to the field of substrate characterization through innovative technology. His work has led to the development of a unique handheld device that enhances the understanding of underground conditions.

Latest Patents

Kuhn holds a patent for a "Hand-held device comprising sensor unit, for characterizing a treated substrate." This handheld device is designed for manual operation by a user. It includes a processing unit that processes underground data and a sensor unit that detects sensor data indicative of the underground's condition before, during, and after processing.

Career Highlights

Throughout his career, Thomas Kuhn has worked with prominent companies such as Würth International AG and Adolf Würth GmbH & Co. KG. His experience in these organizations has contributed to his expertise in developing innovative solutions for substrate analysis.

Collaborations

Kuhn has collaborated with various professionals in his field, including his coworker Jürgen Küenzlen. Their joint efforts have further advanced the technology related to substrate characterization.

Conclusion

Thomas Kuhn's innovative work in developing a handheld device for substrate characterization showcases his significant contributions to the field. His patents and collaborations reflect his commitment to advancing technology in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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