Jena, Germany

Thomas Kuehn

This inventor holds 1 USPTO granted patent. Top assignee: Jena-Optronik Gmbh. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Thomas Kuehn. Retrieved from https://idiyas.com/inventor/thomas-kuehn-42vqco2a

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Thomas Kuehn: Innovator in Spacecraft Positioning Technology

Introduction

Thomas Kuehn is a notable inventor based in Jena, Germany. He has made significant contributions to the field of spacecraft positioning technology. His innovative approach has led to the development of a unique method for determining the position of a spacecraft in space.

Latest Patents

Kuehn holds a patent for a "Method, device and computer program for determining the position of a spacecraft in space." This method involves receiving image data from a variety of differently oriented optics modules. It processes the received image data to compute the position, rate of rotation, and direction of rotation of the spacecraft. The method can be executed using at least one image processing module, along with a device and computer program designed for this purpose.

Career Highlights

Kuehn is associated with Jena-Optronik GmbH, a company that specializes in optical systems and technologies. His work at the company has been pivotal in advancing the capabilities of spacecraft navigation and positioning.

Collaborations

Some of his notable coworkers include Reinhard Berger and Olivier Ballereau. Their collaboration has contributed to the innovative projects at Jena-Optronik GmbH.

Conclusion

Thomas Kuehn's contributions to spacecraft positioning technology exemplify the impact of innovation in the aerospace sector. His patent and work at Jena-Optronik GmbH highlight the importance of advancements in this critical field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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