Ann Arbor, MI, United States of America

Thomas Jon Van Kley

This inventor holds 1 USPTO granted patent. Top assignee: Sap Ag. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Thomas Jon Van Kley. Retrieved from https://idiyas.com/inventor/thomas-jon-van-kley

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Thomas Jon Van Kley: Innovator in Product Demand Forecasting

Introduction

Thomas Jon Van Kley is an accomplished inventor based in Ann Arbor, MI (US). He has made significant contributions to the field of product demand forecasting, showcasing his expertise through his innovative patent.

Latest Patents

Van Kley holds a patent for a system designed to forecast demand data for new products. This system includes generating a phase-in group profile based on similar products. The phase-in group profile consists of multiple demand profiles that account for low, medium, and high demand variations. These demand profiles can be applied to new products within the same phase-in group to create a forecast profile.

Career Highlights

He is currently employed at SAP AG, where he continues to develop and refine his innovative ideas. His work focuses on enhancing the accuracy of demand forecasting, which is crucial for businesses in managing inventory and meeting customer needs.

Collaborations

Some of his notable coworkers include Sheng Li and Hans Karsten Schierholt, with whom he collaborates on various projects within the company.

Conclusion

Thomas Jon Van Kley is a notable inventor whose work in product demand forecasting has the potential to transform how businesses predict and respond to market needs. His contributions are valuable in the ever-evolving landscape of product management.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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