Richmond, NH, United States of America

Thomas J Tague, Jr

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Bruker Optics, Inc.. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Thomas J Tague, Jr. Retrieved from https://idiyas.com/inventor/thomas-j-tague-jr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2010

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Thomas J Tague, Jr: Innovator in Surface Enhanced Raman Spectroscopy

Introduction

Thomas J Tague, Jr. is a notable inventor based in Richmond, NH (US). He has made significant contributions to the field of spectroscopy, particularly through his innovative methods and apparatus for measuring material properties.

Latest Patents

Tague holds a patent for a "Method and apparatus for in situ measurement of material properties by surface enhanced Raman spectroscopy." This invention involves applying an SERS active substrate to a sample using an inkjet nozzle, which allows for the analysis of the sample with a Raman spectrometer in a conventional manner. This method enhances the efficiency and accuracy of material property measurements.

Career Highlights

He is currently associated with Bruker Optics, Inc., where he continues to advance the field of spectroscopy. His work has been instrumental in developing new techniques that improve the analysis of materials.

Collaborations

Tague collaborates with Marco Leona, a fellow expert in the field, to further enhance the capabilities of their research and development efforts.

Conclusion

Thomas J Tague, Jr. is a pioneering inventor whose work in surface enhanced Raman spectroscopy has the potential to transform material analysis. His contributions are invaluable to the scientific community and continue to inspire innovation in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…