Company Filing History:
Years Active: 1998-2000
Title: Thomas G Whitten: Innovator in Memory Device Testing
Introduction
Thomas G Whitten is a notable inventor based in Colorado Springs, CO (US). He has made significant contributions to the field of technology, particularly in the area of memory device testing. With a total of 3 patents to his name, Whitten's work has had a meaningful impact on product testing methodologies.
Latest Patents
One of Whitten's latest patents is the "Graphical test progress monitor." This invention presents a method and computer system for monitoring a suite of product tests as they are being performed. The method includes providing a display that graphically shows the names of suites that have been performed, distinguishing between those that passed and those that failed. Users can selectively identify a suite and view additional information, including the names of tests within the suite and a journal record of performance. The display can be periodically updated based on user preferences.
Another significant patent is the "Method and apparatus for testing memory devices under load." This method verifies the operation of an untrusted memory device while under load. It involves shadowing read and write operations to both untrusted and trusted memory devices. By comparing the data returned from both devices, the method ensures reliability, returning a value from the trusted device if discrepancies are found.
Career Highlights
Whitten is currently employed at Sun Microsystems, Inc., where he continues to innovate and contribute to advancements in technology. His work has been instrumental in enhancing the reliability and efficiency of memory devices.
Collaborations
Some of his notable coworkers include Stephen C Talley and Billy J Fuller, who have collaborated with him on various projects.
Conclusion
Thomas G Whitten is a distinguished inventor whose contributions to memory device testing and product monitoring have paved the way for advancements in technology. His innovative patents reflect his commitment to improving the reliability of memory devices and enhancing testing methodologies.