The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2000

Filed:

Jul. 01, 1996
Applicant:
Inventors:

Thomas G Whitten, Colorado Springs, CO (US);

Stephen C Talley, Colorado Springs, CO (US);

Assignee:

Sun Microsystems, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
714 46 ; 714 25 ;
Abstract

A method and computer system are presented for monitoring a suite of product tests as they are being performed. The tests are collected in named suites of tests. The method includes providing a display and graphically displaying names of suites that have been performed and that were passed on one region of the display and graphically displaying names of suites that have been performed and that were failed on another region of the display. The method also may include allowing a user to selectively identify a name of one of the suites that has been performed and displaying additional information on the display about the selectively identified suites. The additional information may include at least names of the tests within the suite that have been performed and that were passed or failed, and may include a journal record of the performance of the selectively identified. The display may be periodically updated in a period that may be selectively chosen or modified by the user.


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