Austin, TX, United States of America

Thomas Francis Lum

This inventor holds 4 USPTO granted patents. Top assignee: Motorola Corporation. Active years: 1986-1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Thomas Francis Lum. Retrieved from https://idiyas.com/inventor/thomas-francis-lum

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.1

ph-index = 3

Forward Citations = 168(Granted Patents)


Company Filing History:


Years Active: 1986-1999

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4 patents (USPTO):Explore Patents

Title: Thomas Francis Lum: Innovator in Semiconductor Testing

Introduction

Thomas Francis Lum is a notable inventor based in Austin, TX (US). He has made significant contributions to the field of semiconductor testing, holding a total of 4 patents. His work focuses on improving the efficiency and effectiveness of testing integrated circuits.

Latest Patents

Among his latest patents is a test structure for enabling burn-in testing on an entire semiconductor. This innovative test structure utilizes a backing support wafer and a die attach compound to attach multiple segmented individual test integrated circuits. The design includes a top conductive bump layer that connects to a thin film signal distribution layer, which routes electrical signals effectively. This methodology allows for efficient burn-in testing of integrated circuits on a product wafer.

Career Highlights

Thomas Lum is currently associated with Motorola Corporation, where he continues to develop and refine testing methodologies for integrated circuits. His expertise in semiconductor technology has positioned him as a key player in the industry.

Collaborations

He has collaborated with notable professionals, including his coworker James F Wenzel, to advance the field of semiconductor testing.

Conclusion

Thomas Francis Lum's contributions to semiconductor testing through his innovative patents and career at Motorola Corporation highlight his importance in the field. His work continues to influence the efficiency of integrated circuit testing methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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