Company Filing History:
2 out of 1,109 
1 out of 1 
1 out of 633 Years Active: 1980-2016
Title: Thomas F. Michalski: Innovator in Optical Inspection Technologies
Introduction
Thomas F. Michalski is a notable inventor based in Maumee, OH (US), recognized for his contributions to optical inspection technologies. With a total of 4 patents to his name, Michalski has developed innovative methods and apparatuses that enhance the inspection processes of various containers and articles.
Latest Patents
One of his latest patents is titled "Optical Inspection of Containers." This invention describes an apparatus and method for inspecting a container that includes a base and a mouth. The system directs light through the container base into the container and out through the mouth, utilizing at least two light sources positioned beneath the base with differing characteristics. The light transmitted through the mouth is sensed, allowing for the production of a composite image from multiple images of the container mouth.
Another significant patent is "Method of and Apparatus for Electrooptical Inspection of Articles." This electrooptical system illuminates workpieces from a uniform light source and line scans them for light intensity deviations that indicate defects. The system processes pulse trains from photoelectric detectors, identifying events characteristic of defects and compressing data for efficient storage and processing.
Career Highlights
Throughout his career, Thomas F. Michalski has worked with prominent companies such as Owens-Illinois, Inc. and Owens-Illinois Television Products Inc. His experience in these organizations has contributed to his expertise in optical inspection technologies.
Collaborations
Some of his notable coworkers include William E. Johnson and William H. Ryan, who have collaborated with him on various projects throughout his career.
Conclusion
Thomas F. Michalski's innovative work in optical inspection technologies has significantly impacted the field, showcasing his dedication to advancing inspection methods. His patents reflect a commitment to improving the accuracy and efficiency of container and article inspections.