Lichtensteig, Switzerland

Thomas Burgler

This inventor holds 1 USPTO granted patent. Top assignee: Innovative Sensor Technology Ist Ag. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Thomas Burgler. Retrieved from https://idiyas.com/inventor/thomas-burgler

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Thomas Burgler - Innovator in Radiation Technology

Introduction

Thomas Burgler is a notable inventor based in Lichtensteig, Switzerland. He has made significant contributions to the field of radiation technology, particularly with his innovative designs for radiation sources.

Latest Patents

Burgler holds a patent for a radiation source that emits infrared electromagnetic radiation. This invention features a source element made from silicon carbide fiber, which is coated with a metal layer. This metal coating allows the source element to be heated, enabling it to emit infrared radiation at specific times. Additionally, the patent includes a method for manufacturing this radiation source.

Career Highlights

Burgler is associated with Innovative Sensor Technology IST AG, where he applies his expertise in developing advanced sensor technologies. His work has positioned him as a key player in the field of infrared radiation sources.

Collaborations

Burgler has collaborated with notable colleagues, including Jiri Holoubek and Ratnesh Thapliyal, contributing to various projects and innovations in sensor technology.

Conclusion

Thomas Burgler's contributions to radiation technology exemplify his innovative spirit and dedication to advancing the field. His patent for a radiation source highlights his ability to merge practical applications with cutting-edge technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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