Location History:
- Poughkeepsie, NY (US) (2003 - 2005)
- Oberhaching, DE (2007)
- Ottobrunn, DE (2007 - 2008)
Company Filing History:
5 out of 14,743 
1 out of 164,244 
Years Active: 2003-2008
Title: Thomas Boehler: Innovator in Embedded DRAM Testing
Introduction
Thomas Boehler is a notable inventor based in Ottobrunn, Germany. He has made significant contributions to the field of semiconductor testing, particularly in embedded dynamic random access memory (eDRAM) circuits. With a total of five patents to his name, Boehler's work has advanced the efficiency and reliability of testing methodologies in the semiconductor industry.
Latest Patents
Boehler's latest patents include a modular test controller with a built-in self-test (BIST) circuit for testing embedded DRAM circuits. This innovative test controller features a BIST core that utilizes proven testing algorithms, a selectable tester interface for external testing, and an eDRAM interface for direct interaction with memory cells. This invention allows semiconductor device designers to maintain a consistent test flow and reuse a reliable BIST core across multiple ASIC products and generations. Another significant patent involves a circuit and method for testing eDRAM circuits through direct access mode. This invention enables the testing of eDRAMs using conventional memory testers, incorporating BIST logic circuitry and direct access mode logic for effective interfacing.
Career Highlights
Throughout his career, Thomas Boehler has worked with prominent companies in the technology sector. He has been associated with Infineon Technologies AG and IBM, where he contributed to various projects focused on semiconductor technologies and testing solutions. His expertise in the field has positioned him as a valuable asset in the development of innovative testing methodologies.
Collaborations
Boehler has collaborated with notable professionals in the industry, including Gunther Lehmann and Juei Lung Chen. These collaborations have further enriched his work and contributed to advancements in semiconductor testing.
Conclusion
Thomas Boehler's contributions to the field of embedded DRAM testing through his innovative patents and collaborations highlight his significant impact on the semiconductor industry. His work continues to influence the development of efficient testing methodologies, ensuring the reliability of semiconductor devices.