The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2007
Filed:
May. 12, 2003
LI Wang, LaGrangeville, NY (US);
Vasudev Dasappa, Bangalore, IN;
Thomas Boehler, Ottobrunn, DE;
Infineon Technologies AG, Munich, DE;
International Business Machines Corporation, Armonk, NY (US);
Abstract
External test equipment is used to simulate an internal BIST test, thus enabling the capture or generation of detailed test results. By simulating the BIST test sequence in real time during the test, the external tester may monitor an output from the BIST and determine the exact location of failures when they occur. The external tester may generate a bit fail map indicating whether each memory location passed or failed the BIST test.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile