Montreal, Canada

Thierry Giguere

This inventor holds 1 USPTO granted patent. Top assignee: Airy3d Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Thierry Giguere. Retrieved from https://idiyas.com/inventor/thierry-giguere

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Thierry Giguere and Depth-Imaging Innovation.

Introduction

Thierry Giguere is an inventor associated with Montreal, Canada, and Airy3D Inc. His patent work addresses depth imaging, with a focus on correcting for edge and baseline angles.

Latest Patents

Giguere is associated with 1 patent, titled “Edge Angle and Baseline Angle Correction in Depth Imaging.” The patent describes imaging methods and systems that use an angle-sensitive optical encoder and an image sensor with orthogonal pixel axes. The system captures two images from different viewpoints, with the baseline between them obliquely offset from its nominal direction.

The disclosed method identifies an edge in both images, determines the edge’s angle, and measures the parallel disparity between its two appearances. It then uses the disparity, edge angle, and calibration data to determine depth information. This approach is designed to account for geometric offsets that can affect depth estimates.

Career Highlights

Giguere’s listed patent connects his work with computational depth imaging and optical sensing. His association with Airy3D Inc. places this invention within a company focused on imaging technology.

Collaborations

Pascal Grégoire is identified as Giguere’s coworker. The available information does not specify their particular projects or contributions to the patent.

Conclusion

Thierry Giguere’s patent describes a method for improving depth measurements by accounting for edge orientation and baseline alignment, highlighting his contribution to imaging innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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