Neuchâtel, Switzerland

Thierry Aellen

This inventor holds 1 USPTO granted patent and 4 EPO patents. Top assignee: Sy & Se Sa. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Thierry Aellen. Retrieved from https://idiyas.com/inventor/thierry-aellen-noxzfgjl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Thierry Aellen: Innovator in Thin Film Adhesion

Introduction

Thierry Aellen is a notable inventor based in Neuchâtel, Switzerland. He has made significant contributions to the field of thin film technology, particularly in the area of adhesion methods. His innovative approach has led to advancements that are valuable in various applications.

Latest Patents

Aellen holds a patent for a method that promotes the adhesion of thin films or functional layers to substrates. This invention involves the application of a pulsed and/or alternating voltage, which enhances the bonding process. His patent is a testament to his expertise and creativity in addressing challenges in material science.

Career Highlights

Throughout his career, Aellen has worked with several organizations, including Sy & Se SA and Haute Ecole Arc. His experience in these institutions has allowed him to refine his skills and contribute to important projects in the field of technology and education.

Collaborations

Aellen has collaborated with talented individuals such as Florian Telmont and Sébastien Brun. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Thierry Aellen's work in thin film adhesion exemplifies the impact of innovative thinking in technology. His contributions continue to influence the industry and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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