Company Filing History:
Years Active: 2016
Title: The Innovations of Theodore James Reck in Micromachining Technology
Introduction
Theodore James Reck, an inventive mind located in Charlottesville, VA, has made significant contributions to the field of micromachining. His work focuses on creating advanced on-wafer probes that cater to the demands of modern integrated circuits, showcasing how innovative thinking can lead to practical solutions in technology.
Latest Patents
Reck holds a notable patent for the invention titled "Micromachined On-Wafer Probes and Related Method." This innovative micromachining process enables the fabrication of a single chip that seamlessly drops into its supporting structure. The technology allows for the development of a probing device capable of interfacing with integrated circuits that operate at frequencies from about 100 GHz to approximately 3,000 GHz (3 THz). The silicon structure crafted through this process provides the necessary mechanical force for efficient probing while facilitating the transfer of high-frequency energy between measurement systems and integrated circuits, individual devices, or materials.
Career Highlights
Theodore James Reck is associated with the University of Virginia Patent Foundation, where his innovative endeavors continue to thrive. His background in micromachining and dedication to advancing technology underline his commitment to the field.
Collaborations
Throughout his career, Reck has collaborated with esteemed colleagues such as Robert M. Weikle, II, and Arthur Weston Lichtenberger. This collaboration fosters a rich environment for innovation, enabling the exploration of more advanced solutions in electronic interfacing and measurement systems.
Conclusion
Theodore James Reck stands out as a prominent figure in the realm of micromachining, with his patented technology paving the way for enhanced interactions between probing devices and integrated circuits. His contributions not only reflect his ingenuity but also symbolize the ongoing advancement in electronic measurement techniques essential for the future of technology.