Kapellen, Belgium

Theodore F Eberle, Jr

This inventor holds 3 USPTO granted patents. Top assignee: Hoover Universal, Inc.. Active years: 1994-1995.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Theodore F Eberle, Jr. Retrieved from https://idiyas.com/inventor/theodore-f-eberle-jr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 3

Forward Citations = 375(Granted Patents)


Company Filing History:


Years Active: 1994-1995

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3 patents (USPTO):Explore Patents

Title: The Innovations of Theodore F Eberle, Jr.

Introduction

Theodore F Eberle, Jr. is a notable inventor based in Kapellen, Belgium. He has made significant contributions to the field of engineering, particularly through his innovative designs and patents. With a total of three patents to his name, Eberle has demonstrated a commitment to advancing technology and improving existing products.

Latest Patents

Among his latest patents is the innovative design for a container sidewall. This invention showcases Eberle's ability to enhance functionality and efficiency in container design. His work in this area reflects a deep understanding of material properties and structural integrity.

Career Highlights

Eberle is currently employed at Hoover Universal, Inc., where he continues to develop and refine his inventions. His role at the company allows him to collaborate with other talented engineers and contribute to various projects that push the boundaries of technology.

Collaborations

One of his notable coworkers is Dwayne G Vailliencourt. Together, they work on projects that leverage their combined expertise to create innovative solutions in their field.

Conclusion

Theodore F Eberle, Jr. is a distinguished inventor whose work has made a significant impact in engineering. His patents and collaborations reflect his dedication to innovation and excellence in design.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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