Company Filing History:
Years Active: 2025
Title: Tharesh Sharma: Innovator in Defect Detection Technology
Introduction
Tharesh Sharma is a notable inventor based in Waiblingen, Germany. He has made significant contributions to the field of defect detection in point cloud data. His innovative approach has led to the development of a patented method that enhances the accuracy of identifying defects on object surfaces.
Latest Patents
Tharesh Sharma holds a patent for a method titled "Defect detection in a point cloud." This patent describes a process that includes performing a first scan of an object to generate first scan data. The method further involves detecting a defect on the surface of the object by analyzing the first scan data to identify a region of interest containing the defect. This is achieved by comparing the first scan data to reference scan data. Additionally, the method includes performing a second scan of the region of interest to generate higher resolution second scan data. Finally, the first and second scan data are combined to create a comprehensive point cloud of the object. He has 1 patent to his name.
Career Highlights
Tharesh Sharma is currently employed at Faro Technologies, Inc., a company known for its advanced 3D measurement and imaging solutions. His work at Faro Technologies has allowed him to apply his expertise in defect detection and contribute to the company's innovative projects.
Collaborations
One of his notable coworkers is Georgios Balatzis, with whom he collaborates on various projects within the company.
Conclusion
Tharesh Sharma's contributions to defect detection technology exemplify the impact of innovative thinking in engineering. His patented method not only enhances the accuracy of defect identification but also showcases the potential for advancements in 3D imaging and measurement technologies.