The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2025

Filed:

Jul. 27, 2022
Applicant:

Faro Technologies, Inc., Lake Mary, FL (US);

Inventors:

Georgios Balatzis, Fellbach, DE;

Tharesh Sharma, Waiblingen, DE;

Assignee:

FARO TECHNOLOGIES, Lake Mary, FL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/82 (2022.01); G01S 17/48 (2006.01); G06N 3/044 (2023.01); G06T 3/4053 (2024.01); G06T 7/521 (2017.01);
U.S. Cl.
CPC ...
G06V 10/82 (2022.01); G01S 17/48 (2013.01); G06N 3/044 (2023.01); G06T 3/4053 (2013.01); G06T 7/521 (2017.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

Examples described herein provide a method that includes performing a first scan of an object to generate first scan data. The method further includes detecting a defect on a surface of the object by analyzing the first scan data to identify a region of interest containing the defect by comparing the first scan data to reference scan data. The method further includes performing a second scan of the region of interest containing the defect to generate second scan data, the second scan data being higher resolution scan data than the first scan data. The method further includes combining the first scan data and the second scan data to generate a point cloud of the object.


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