Thamaraiselvan Subramani

Title: Thamaraiselvan Subramani: Innovator in Integrated Circuit Testing

Introduction

Thamaraiselvan Subramani is a notable inventor based in Tamil Nadu, India. He has made significant contributions to the field of integrated circuits, particularly in the area of delay defect testing. His innovative approach addresses critical challenges in the performance and reliability of electronic devices.

Latest Patents

Thamaraiselvan holds a patent for a method of delay defect testing of power drop effects in integrated circuits. This invention provides a systematic approach to generating test patterns based on a transition fault model type. The method evaluates dynamic voltage drops during capture cycles and performs static timing analysis to ensure that all paths meet timing requirements. His patent is a valuable asset in enhancing the reliability of integrated circuits.

Career Highlights

Thamaraiselvan is currently employed at International Business Machines Corporation (IBM), where he applies his expertise in integrated circuit design and testing. His work at IBM has allowed him to contribute to cutting-edge technology and collaborate with other talented professionals in the field.

Collaborations

Thamaraiselvan has worked alongside colleagues such as Raghu Gaurav GopalaKrishnaSetty and Balaji Upputuri. These collaborations have fostered a creative environment that encourages innovation and the development of new technologies.

Conclusion

Thamaraiselvan Subramani is a distinguished inventor whose work in integrated circuit testing has made a significant impact on the industry. His patent and contributions at IBM highlight his commitment to advancing technology and improving electronic device performance.