Portland, OR, United States of America

Thaddeus T Shannon, Iii

This inventor holds 1 USPTO granted patent. Top assignee: Lsi Corporation. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Thaddeus T Shannon, Iii. Retrieved from https://idiyas.com/inventor/thaddeus-t-shannon-iii

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Thaddeus T Shannon, III: Innovator in Data Analysis

Introduction

Thaddeus T Shannon, III is a notable inventor based in Portland, OR. He has made significant contributions to the field of data analysis, particularly through his innovative methods for isolating sources of variance in parametric data. His work has implications for various industries that rely on data-driven decision-making.

Latest Patents

Thaddeus holds a patent for a method of isolating sources of variance in parametric data. This patent outlines a systematic approach that includes cleaning a data set, generating a principal component analysis basis, and estimating an independent component analysis model. The method allows for the identification and removal of minor components, ensuring that the final model is robust and reliable.

Career Highlights

Thaddeus is currently employed at LSI Corporation, where he applies his expertise in data analysis. His work at the company has allowed him to collaborate with other talented professionals in the field.

Collaborations

Some of Thaddeus's coworkers include David A Abercrombie and James McNames. Their collective efforts contribute to advancing the company's goals and enhancing the quality of their data analysis projects.

Conclusion

Thaddeus T Shannon, III is a distinguished inventor whose work in data analysis has paved the way for more effective methods in understanding parametric data. His contributions are valuable to the ongoing evolution of data science and its applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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