Ebina, Japan

Tetsuya Yamada

This inventor holds 1 USPTO granted patent. Top assignee: Kanagawa Institute of Industrial Science and Technology. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tetsuya Yamada. Retrieved from https://idiyas.com/inventor/tetsuya-yamada-insji2h5

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Tetsuya Yamada: Innovator in Measurement Technology

Introduction

Tetsuya Yamada is a prominent inventor based in Ebina, Japan. He has made significant contributions to the field of measurement technology, particularly through his innovative patent that addresses the measurement of target substances.

Latest Patents

Yamada holds a patent for a "Measurement instrument and method for measuring target substance using same." This invention provides a measuring device that includes a first container and a second container arranged adjacent to each other. A partition wall is provided between the two containers, featuring through holes for forming lipid bilayers. The device also incorporates gas flow paths with hydrophobic surfaces, allowing for effective measurement of substances.

Career Highlights

Tetsuya Yamada is affiliated with the Kanagawa Institute of Industrial Science and Technology, where he continues to advance his research and development efforts. His work has garnered attention for its practical applications in various scientific fields.

Collaborations

Yamada has collaborated with notable colleagues, including Shoji Takeuchi and Hirotaka Sugiura. These partnerships have contributed to the advancement of innovative technologies in measurement.

Conclusion

Tetsuya Yamada's contributions to measurement technology exemplify the spirit of innovation. His patent reflects a commitment to enhancing measurement methods, showcasing the importance of scientific advancement in practical applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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