Tokyo, Japan

Tetsuya Yadoguchi

This inventor holds 1 USPTO granted patent. Top assignee: Nippon Steel Sumitomo Metal Corporation. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tetsuya Yadoguchi. Retrieved from https://idiyas.com/inventor/tetsuya-yadoguchi-jkg2yu7f

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Tetsuya Yadoguchi: Innovator in Defect Classification Technology

Introduction

Tetsuya Yadoguchi is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of defect classification technology. His innovative approach aims to enhance the accuracy of defect type classification, which is crucial in various industrial applications.

Latest Patents

Yadoguchi holds a patent for a defect classification apparatus. This invention addresses the challenge of over-fitting in defect classification. The apparatus maps feature information of a defect to a higher-dimensional space, allowing for more accurate classification based on a decision boundary. The discriminant function used in this apparatus minimizes classification errors while considering the dimensionality of the decision boundary.

Career Highlights

Yadoguchi is associated with Nippon Steel Sumitomo Metal Corporation, where he applies his expertise in defect classification. His work has been instrumental in improving the quality control processes within the company. With a focus on innovation, he continues to push the boundaries of technology in his field.

Collaborations

Yadoguchi collaborates with notable colleagues such as Shinya Yoshikawa and Tamotsu Nishimine. Their combined efforts contribute to advancements in defect classification and related technologies.

Conclusion

Tetsuya Yadoguchi's work in defect classification technology exemplifies the impact of innovation in industrial applications. His patent and collaborations highlight his commitment to enhancing accuracy and efficiency in defect detection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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