Tochigi, Japan

Tetsuro Hayashi

This inventor holds 1 USPTO granted patent. Top assignee: Honda Motor Co., Ltd.. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tetsuro Hayashi. Retrieved from https://idiyas.com/inventor/tetsuro-hayashi-hvph87lg

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Tetsuro Hayashi: Inventor in Dust Detection

Introduction

Tetsuro Hayashi is an inventor associated with Tochigi, Japan, and Honda Motor Co., Ltd. His patent work addresses methods for detecting dust and preventing erroneous dust-detection determinations.

Latest Patents

The provided information lists one patent for Hayashi: “Method of Detecting Dust and Method of Preventing Erroneous Determination of Dust Detection.” The method monitors changes in electrical resistance over time. It first checks whether the resistance variation per unit time meets or exceeds a first threshold, then monitors whether a subsequent variation falls at or below a second threshold. It next compares the resistance values associated with those measurements against a third threshold. When their difference meets or exceeds that threshold, the method determines that dust has been generated.

Career Highlights

Hayashi’s listed invention focuses on using sequential resistance measurements and threshold comparisons to identify dust while helping prevent erroneous determinations. The supplied information associates him with Honda Motor Co., Ltd.

Collaborations

The listed coworkers are Masamitsu Numano and Junya Tanabe. The available information does not specify their roles in Hayashi’s patent or other work.

Conclusion

Tetsuro Hayashi’s listed patent describes a threshold-based approach to dust detection designed to support more reliable determinations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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