Chofu, Japan

Tetsuo Ueyama

This inventor holds 3 USPTO granted patents. Top assignee: Juki Corporation. Active years: 1997-1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tetsuo Ueyama. Retrieved from https://idiyas.com/inventor/tetsuo-ueyama-b4yxcq9n

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.2

ph-index = 3

Forward Citations = 25(Granted Patents)


Location History:

  • Tokyo, JP (1997)
  • Chofu, JP (1998 - 1999)

Company Filing History:


Years Active: 1997-1999

Loading Chart...
3 patents (USPTO):Explore Patents

Title: Tetsuo Ueyama: Innovator in Sewing Technology

Introduction

Tetsuo Ueyama is a notable inventor based in Chofu, Japan. He has made significant contributions to the field of sewing technology, holding a total of 3 patents. His work has been instrumental in advancing the capabilities of sewing machines.

Latest Patents

Among his latest innovations is a sewing machine that showcases his expertise and creativity. This invention reflects his commitment to improving the efficiency and functionality of sewing equipment.

Career Highlights

Tetsuo Ueyama is currently employed at Juki Corporation, a leading company in the sewing machine industry. His role at Juki has allowed him to further develop his ideas and bring innovative products to market.

Collaborations

He has collaborated with his coworker, Sanae Takada, to enhance the design and functionality of their sewing machines. Their teamwork has resulted in advancements that benefit users worldwide.

Conclusion

Tetsuo Ueyama's contributions to sewing technology through his patents and work at Juki Corporation highlight his importance in the industry. His innovations continue to shape the future of sewing machines.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…