This inventor holds 1 USPTO granted patent. Top assignee: Kabushiki Kaisha Topcon. Active years: 2012.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2012
Title: Tetsuharu Anai: Innovator in Image Measurement Technology
Introduction
Tetsuharu Anai is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of image measurement technology. His innovative approach has led to the development of a unique patent that enhances the precision of measuring distant objects.
Latest Patents
Tetsuharu Anai holds a patent for an "Image measurement apparatus for creating a panoramic image." This invention involves a measurement processing block that obtains multiple first images of the object to be measured, taken with very small movements in the imaging area. A feature extraction processing block then extracts an approximate feature portion of the object from these images. Following this, a partial-image creation processing block creates several first partial images by grouping the first images around the extracted feature portion. Finally, a super-resolution-image creation processing block generates a super-resolution image from the first partial images. This innovative process allows for precise and easy measurement of detailed features of an object, even when it is located far away.
Career Highlights
Tetsuharu Anai is associated with Kabushiki Kaisha Topcon, a company known for its advancements in measurement and imaging technologies. His work at Topcon has been instrumental in pushing the boundaries of what is possible in image measurement.
Collaborations
Tetsuharu Anai has collaborated with notable colleagues, including Nobuo Kochi and Hitoshi Ohtani. Their combined expertise has contributed to the success of various projects within the company.
Conclusion
Tetsuharu Anai's innovative contributions to image measurement technology exemplify the impact of dedicated inventors in advancing scientific and technological frontiers. His patent showcases the potential for precise measurements in challenging conditions, marking a significant achievement in his field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile