This inventor holds 2 USPTO granted patents and 2 published patent applications. Top assignee: Nippon Steel Texeng. Co., Ltd.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Teruhito Ishibashi and Battery Inspection Technology.
Introduction
Teruhito Ishibashi is an inventor associated with Tokyo, Japan, and Nippon Steel Texeng. Co., Ltd. His patent work focuses on probe units and equipment for inspecting battery charging and discharging. His listed portfolio includes 2 patents.
Latest Patents
Ishibashi’s listed inventions address the design and operation of charge/discharge inspection systems.
“Charge/discharge inspection device and charge/discharge inspection equipment” describes a probe unit with a base board, integrated power supply boards, and electrically connected probes. The power supply boards include controls for charge/discharge inspection, while cooling means in the base board help cool the boards.
“Probe unit and charge/discharge inspection device” describes opposing probe-holding plates, with positive-electrode probes on one plate and corresponding negative-electrode probes on the other. A moving mechanism allows one or both plates to move toward or away from each other, supporting adjustment of the probe arrangement.
Career Highlights
The available information connects Ishibashi’s work with Nippon Steel Texeng. Co., Ltd. and highlights his contributions to battery inspection equipment. His inventions address both electrical control and cooling, as well as the positioning of probes used during inspection.
Collaborations
Tomoki Haraguchi and Shigeru Saito are identified as Ishibashi’s coworkers. The supplied information does not specify their roles in the listed patents.
Conclusion
Teruhito Ishibashi’s listed patents focus on practical improvements to charge/discharge inspection devices, including board cooling, inspection controls, and adjustable probe positioning.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile