Osaka, Japan

Teruhiko Hiraishi

This inventor holds 1 USPTO granted patent. Top assignee: Matsushita Electric Industrial Co., Ltd.. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Teruhiko Hiraishi. Retrieved from https://idiyas.com/inventor/teruhiko-hiraishi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1

Forward Citations = 23(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: Teruhiko Hiraishi and Microwave Oven Innovation.

Introduction

Teruhiko Hiraishi is an inventor associated with Osaka, Japan, and Matsushita Electric Industrial Co., Ltd. His recorded patent concerns microwave technology designed to improve the defrosting process.

Latest Patents

Hiraishi is credited with 1 patent, titled “Microwave oven.” The invention describes a microwave oven with a magnetron that generates microwaves and a waveguide that carries them into the heating chamber. During defrosting, the oven propagates microwaves that vary irregularly over time and are in a chaotic state, particularly as water in the target shifts from a solid to a liquid phase.

Career Highlights

The patent reflects Hiraishi’s work on microwave heating and controlled defrosting. His professional association with Matsushita Electric Industrial Co., Ltd. connects his invention to the company’s development of consumer electronics and appliances.

Collaborations

Hiraishi’s listed coworkers include Tetsuya Koda and Emiko Ishizaki. Their shared association provides context for the professional environment surrounding his patented work.

Conclusion

Teruhiko Hiraishi’s microwave oven patent focuses on using time-irregular, chaotic microwaves during defrosting, highlighting an approach to managing the transition of water from a frozen to a liquid state.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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