Kenosha, WI, United States of America

Terry J Willems

This inventor holds 1 USPTO granted patent. Top assignee: Construction Technology Laboratories, Inc.. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Terry J Willems. Retrieved from https://idiyas.com/inventor/terry-j-willems

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Terry J Willems

Introduction

Terry J Willems is a notable inventor based in Kenosha, WI (US). She has made significant contributions to the field of construction technology. Her innovative approach has led to the development of a unique method for testing the hardness of concrete surfaces.

Latest Patents

Willems holds a patent for a "Method and apparatus for testing relative hardness of horizontally displaced surfaces." This invention features a weighted platform equipped with scratching pins arranged in a trapezoidal formation. The apparatus is designed to be translated over horizontal concrete surfaces to assess their hardness. If the surface scratches during the testing process, it indicates that the desired hardness level has not been achieved. This invention is crucial for ensuring the quality and durability of concrete surfaces in construction.

Career Highlights

Terry J Willems is associated with Construction Technology Laboratories, Inc., where she applies her expertise in developing innovative solutions for the construction industry. Her work focuses on enhancing the methods used in construction testing and quality assurance.

Conclusion

Terry J Willems exemplifies the spirit of innovation in the construction sector. Her contributions, particularly in testing concrete hardness, showcase her commitment to improving construction practices. Her work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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