Rochester, MN, United States of America

Terry J Opie

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Terry J Opie. Retrieved from https://idiyas.com/inventor/terry-j-opie

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: The Innovations of Terry J Opie

Introduction

Terry J Opie is a notable inventor based in Rochester, MN (US). She has made significant contributions to the field of hardware design verification. Her innovative approach focuses on enhancing the efficiency of testing methods for hardware devices.

Latest Patents

Terry J Opie holds a patent for a "Method and apparatus to verify non-deterministic results in an efficient random manner." This invention is directed towards a system, method, and article of manufacture for testing and design verification of hardware devices. It provides for random accesses to the registers of a device under test, which may more closely resemble actual accesses during normal operation. This approach allows for a more thorough testing process.

Career Highlights

Terry is currently employed at International Business Machines Corporation, commonly known as IBM. Her work at IBM has allowed her to apply her innovative ideas in a practical setting, contributing to advancements in technology.

Collaborations

Throughout her career, Terry has collaborated with notable colleagues, including Gerald G Fagerness and Paul E Schardt. These collaborations have further enriched her work and expanded the impact of her inventions.

Conclusion

Terry J Opie's contributions to hardware design verification through her innovative patent demonstrate her commitment to improving technology. Her work continues to influence the field and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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