Teppei Aoki

Title: Teppei Aoki: Innovator in Wafer Test Systems

Introduction

Teppei Aoki is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of semiconductor testing through his innovative designs and patents. His work focuses on improving the efficiency and effectiveness of wafer testing systems.

Latest Patents

Teppei Aoki holds a patent for a wafer test system, which includes a prober that holds a semiconductor wafer and a probe card with probe needles. This system allows for the inspection of semiconductor chips formed on the wafer. The patent also describes an overhead hoist transport that delivers and withdraws cassettes containing multiple semiconductor wafers for inspection. Additionally, it features a conveying control unit that manages the movement of the probe card between predetermined positions and a card conveying mechanism that facilitates the handling of the probe card within the prober.

Career Highlights

Aoki is currently employed at Tokyo Seimitsu Co., Ltd., a company known for its advanced semiconductor manufacturing equipment. His work has been instrumental in enhancing the capabilities of wafer testing technologies. With a focus on innovation, Aoki continues to push the boundaries of what is possible in semiconductor testing.

Collaborations

Throughout his career, Teppei Aoki has collaborated with notable colleagues, including Akira Yamaguchi and Yuta Sato. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies in the semiconductor industry.

Conclusion

Teppei Aoki is a key figure in the advancement of wafer test systems, with a patent that showcases his innovative approach to semiconductor testing. His contributions to Tokyo Seimitsu Co., Ltd. and collaborations with fellow inventors highlight his commitment to excellence in the field.