Shenzhen, China

Te-Yu Kao

This inventor holds 1 USPTO granted patent. Top assignee: Shenzhen Dikai Industrial Co., Ltd. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Te-Yu Kao. Retrieved from https://idiyas.com/inventor/te-yu-kao-4dvythz0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Te-Yu Kao: Innovator in Diamond Measurement Technology.

Introduction

Te-Yu Kao is a notable inventor based in Shenzhen, China. He has made significant contributions to the field of measurement technology, particularly with his innovative designs. His work is characterized by a commitment to precision and quality.

Latest Patents

Te-Yu Kao holds a patent for a diamond measuring ruler. This invention showcases his expertise in creating tools that enhance accuracy in measuring diamonds, which is crucial for the jewelry industry. He has 1 patent to his name, reflecting his innovative spirit and dedication to advancing measurement technology.

Career Highlights

Te-Yu Kao is currently employed at Shenzhen Dikai Industrial Co., Ltd. His role at the company allows him to apply his inventive skills in a practical setting, contributing to the development of high-quality measurement tools. His work has garnered attention within the industry for its focus on precision and reliability.

Collaborations

Te-Yu collaborates with Xiuling Zhu, a talented woman in the field. Their partnership exemplifies the importance of teamwork in driving innovation and achieving successful outcomes in their projects.

Conclusion

Te-Yu Kao is a remarkable inventor whose contributions to diamond measurement technology are noteworthy. His patent for the diamond measuring ruler highlights his innovative approach and commitment to excellence. Through his work at Shenzhen Dikai Industrial Co., Ltd., he continues to make strides in the field of measurement technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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