Taoyuan, Taiwan

Te-Chen Peng

This inventor holds 1 USPTO granted patent. Top assignee: Teco Image System Co., Ltd.. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Te-Chen Peng. Retrieved from https://idiyas.com/inventor/te-chen-peng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Te-Chen Peng: Innovator in Scanning Technology

Introduction

Te-Chen Peng is a notable inventor based in Taoyuan Hsien, Taiwan. He has made significant contributions to the field of scanning technology, particularly through his innovative patent that enhances the functionality of scanning apparatuses.

Latest Patents

Te-Chen Peng holds a patent for a "Calibrating and positioning structure of scanning apparatus." This invention provides a calibrating and positioning structure that includes a scanning platform and a scanning window with a wide edge. The structure consists of a calibrating part aligned with the wide edge of the scanning window and at least one positioning part that partially overlaps with the calibrating part, although it is not aligned with the wide edge. This innovation aims to improve the accuracy and efficiency of scanning processes.

Career Highlights

Te-Chen Peng is associated with Teco Image System Co., Ltd., where he applies his expertise in developing advanced scanning technologies. His work has contributed to the company's reputation as a leader in imaging solutions.

Collaborations

Te-Chen collaborates with Li-Ju Huang, who is also a key figure in the development of imaging technologies at Teco Image System Co., Ltd. Their partnership exemplifies the collaborative spirit in the field of innovation.

Conclusion

Te-Chen Peng's contributions to scanning technology through his patent demonstrate his commitment to innovation and excellence. His work continues to influence the industry and pave the way for future advancements in imaging solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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