Vernon Hills, IL, United States of America

Tayy-Wen Jeng

This inventor holds 2 USPTO granted patents. Top assignee: Abbott Laboratories Corporation. Active years: 2000-2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tayy-Wen Jeng. Retrieved from https://idiyas.com/inventor/tayy-wen-jeng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 2

Forward Citations = 314(Granted Patents)


Company Filing History:


Years Active: 2000-2003

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2 patents (USPTO):Explore Patents

Title: Innovations of Tayy-Wen Jeng

Introduction

Tayy-Wen Jeng is a notable inventor based in Vernon Hills, IL (US). She has made significant contributions to the field of sensor technology, holding two patents that showcase her innovative spirit and technical expertise.

Latest Patents

Her latest patent is titled "Multiplex sensor and method of use." This invention provides enhanced selectivity and sensitivity in measuring one or more parameters of a sample. The method employs multiple spectroscopic techniques to reduce or eliminate interferences from physiological and spectral variables. In one embodiment, the multiplex sensor allows for the measurement of parameters using at least two different spectroscopic techniques, which are selected from a specific group of methods.

Career Highlights

Tayy-Wen Jeng is currently associated with Abbott Laboratories Corporation, a leading company in the healthcare sector. Her work at Abbott has allowed her to focus on developing advanced sensor technologies that can significantly impact various applications in health and science.

Collaborations

Throughout her career, she has collaborated with esteemed colleagues, including Gary M Oosta and John M Lindberg. These collaborations have further enriched her research and development efforts.

Conclusion

Tayy-Wen Jeng's contributions to sensor technology through her patents reflect her dedication to innovation and excellence in her field. Her work continues to pave the way for advancements in measurement techniques that can benefit various industries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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