Georgetown, Malaysia

Tatt-Wee Oong

This inventor holds 1 USPTO granted patent. Top assignee: National Instruments Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tatt-Wee Oong. Retrieved from https://idiyas.com/inventor/tatt-wee-oong-9xtli5n8

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Tatt-Wee Oong and Virtual Resistance Control

Introduction

Tatt-Wee Oong is an inventor associated with Georgetown, Malaysia. His patent work addresses control-system performance in constant-voltage operation.

Latest Patents

Oong is associated with 1 patent, titled “System and Method for Virtual Resistance.” The invention describes a control system designed to improve dynamic performance in constant-voltage (CV) mode while remaining invariant to the source type and operating point. It achieves this by using a voltage-controlled resistance as the control element in the system’s feedback loop, replacing a voltage-controlled current source, potentially with few or no additional circuit components. The system measures an input voltage from a device under test, determines a feedback control voltage based at least partly on that measurement, and applies the combined voltage to operate the device in CV mode.

Career Highlights

Oong is associated with National Instruments Corporation. His patent reflects work on feedback control and electronic testing systems.

Collaborations

Hao-Jie Chan is identified as Oong’s coworker. The available information does not specify Chan’s role in the patent or the nature of their collaboration.

Conclusion

Tatt-Wee Oong’s patent focuses on improving constant-voltage control through a virtual-resistance approach, with the aim of enhancing dynamic performance while minimizing changes to the control circuit.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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