Nagoya, Japan

Tatsuya Yamada

This inventor holds 1 USPTO granted patent. Top assignee: Sintokogio, Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tatsuya Yamada. Retrieved from https://idiyas.com/inventor/tatsuya-yamada-pwdjgu3d

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Tatsuya Yamada: Innovator in Metal Detection Technology

Introduction

Tatsuya Yamada is a prominent inventor based in Nagoya, Japan. He has made significant contributions to the field of metal detection technology. His innovative approach has led to the development of a unique metal detecting device that enhances the efficiency of identifying metal objects.

Latest Patents

Tatsuya Yamada holds a patent for a metal detecting device and method. This device features a transfer section that moves an inspection target object along a path between two magnets. It includes a first magnetic sensor aligned with the first magnet, which outputs a first signal, and a second magnetic sensor aligned with the second magnet, which outputs a second signal. The device determines whether the inspection target object contains metal based on the strength of the first signal and the phase difference between the two signals. He has 1 patent to his name.

Career Highlights

Yamada is associated with Sintokogio, Ltd., a company known for its advancements in various technological fields. His work at Sintokogio has allowed him to focus on developing innovative solutions that address real-world challenges in metal detection.

Collaborations

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Conclusion

Tatsuya Yamada's contributions to metal detection technology exemplify the spirit of innovation. His patented device showcases his ability to combine engineering principles with practical applications. His work continues to influence the industry and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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