Sakura, Japan

Tatsushi Ogasawara

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Fujikura Limited. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tatsushi Ogasawara. Retrieved from https://idiyas.com/inventor/tatsushi-ogasawara

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Innovations by Tatsushi Ogasawara

Introduction

Tatsushi Ogasawara is a notable inventor based in Sakura, Japan. He has made significant contributions to the field of optical fiber technology. His work focuses on improving the inspection and manufacturing processes of optical fiber units.

Latest Patents

Ogasawara holds a patent for an "Inspection device of optical fiber unit and method of manufacturing optical fiber unit." This innovative device includes a measurement sensor that assesses the width of optical fiber units in a direction orthogonal to their longitudinal extension. Additionally, it features a determination circuit that identifies any abnormalities in the binding state based on the sensor's measurements. He has 1 patent to his name.

Career Highlights

Ogasawara is currently employed at Fujikura Limited, a company renowned for its advancements in telecommunications and optical fiber technology. His role involves developing cutting-edge solutions that enhance the efficiency and reliability of optical fiber units.

Collaborations

Some of his coworkers include Yuki Nemoto and Tomoaki Kaji, who contribute to the innovative environment at Fujikura Limited.

Conclusion

Tatsushi Ogasawara's work exemplifies the spirit of innovation in the optical fiber industry. His contributions are paving the way for advancements that will benefit various technological applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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