Gunma, Japan

Tatsushi Arai

This inventor holds 1 USPTO granted patent. Top assignee: Sanyo Electric Co., Ltd.. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tatsushi Arai. Retrieved from https://idiyas.com/inventor/tatsushi-arai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Innovations by Tatsushi Arai in Optical Disc Technology.

Introduction

Tatsushi Arai is a notable inventor based in Gunma, Japan. He has made significant contributions to the field of optical disc technology. His work focuses on enhancing the performance and reliability of optical disc apparatuses.

Latest Patents

Tatsushi Arai holds a patent for an "Optical disc apparatus and method of setting defocus value thereof." This invention includes a jitter value detecting circuit that identifies a jitter value based on signals read from an optical disc. Additionally, it features a defocus value setting circuit that adjusts the defocus value for moving an objective lens along the light axis during focusing. This adjustment is based on the signal processed through the jitter value detecting circuit, allowing for precise defocus adjustments.

Career Highlights

Arai is associated with Sanyo Electric Co., Ltd., where he has contributed to various projects related to optical technologies. His expertise in this area has led to advancements that improve the functionality of optical disc devices.

Collaborations

Arai has worked alongside Yasuhiro Muraoka, collaborating on projects that leverage their combined expertise in optical technologies.

Conclusion

Tatsushi Arai's innovations in optical disc technology demonstrate his commitment to advancing this field. His patent reflects a significant step forward in improving optical disc apparatuses, showcasing his role as a key inventor in this domain.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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